发明名称 ILLUMINATION SYSTEM FOR MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an illumination system for microlithographic projection exposure apparatus. <P>SOLUTION: An illumination system for a microlithographic projection exposure apparatus comprises a light source (30) and an optical integrator (56). The optical integrator possesses first optical elements (561X, 561Y, 562X, 562Y) and produces a plurality of secondary light sources (82) each emitting a light beam. A light condenser (62) enables the beam to superpose in mask surface (70). At least one of dispersion structures (58, 60) comprises a plurality of independently designed second optical elements disposed in front of or back of the second light source. The first and second optical elements are configured to enable the optical elements irradiated by same irradiance distribution to be spaced above 5 mm. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012028767(A) 申请公布日期 2012.02.09
申请号 JP20110152698 申请日期 2011.07.11
申请人 CARL ZEISS SMT GMBH 发明人 VANCLAR JOSEPHUS;SIECKMANN HEICO;WEEVIL KENNETH;RALF SCHARNWEBER;MANFRED MAUL;MARKUS DEGUNTHER;MICHAEL LAI;SCHOLZ AXEL;UWE SPENGLER;REINHARD VOELKEL
分类号 H01L21/027;G02B3/00;G02B5/02;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址