发明名称 GRAPHIC DATA CREATION METHOD FOR PROCESS MARKS AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To avoid necessity of management of rotation direction and/or reduction in the visibility of pattern after rotation relating to a rotation operation in layout of process marks formed in a scribe region. <P>SOLUTION: The graphic data creation method for process marks includes a step in which at least one element graphic 620 is extracted from a tentative process mark 605 including predetermined element graphics 610 and 620. The method further includes a step in which a reference process mark 600 having a double rotational symmetry with respect to a rotation center 600c is created by adding another element graphic 630, in which the extracted element graphic 620 is rotated by, for example, 180&deg; on the rotation center 600c, to the tentative process mark 605. Also, in place of 180&deg;, the element graphic 620 may be rotated by 90&deg;, and after rotating the reference process mark by 90&deg;, an element graphic which faces in an identical direction of the element graphic 620 before the rotation operation may be added. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012027400(A) 申请公布日期 2012.02.09
申请号 JP20100168479 申请日期 2010.07.27
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 YOSHIDA MIKI
分类号 G03F1/38 主分类号 G03F1/38
代理机构 代理人
主权项
地址