发明名称 RADIATION-SENSITIVE RESIN COMPOSITION, PROCESS FOR FORMING RESIST PATTERN, POLYMER AND COMPOUND
摘要 <p>PURPOSE: A radiation-sensitive resin composition, a resist pattern forming method, polymer, and compounds are provided to efficiently form resist patterns by improving surface wettability in a short period of time. CONSTITUTION: A radiation-sensitive resin composition includes a fluorine-containing compound and a radiation-sensitive acid generator. The fluorine-containing compound includes a group represented by chemical formula 1. In the chemical formula 1, the RC is p+1-valent aromatic cyclic group which is capable of being substituted. The Q is a linker which is one of monovalent hydrophilic groups except for one hydrogen atom. The RE is C1 to C10 hydrocarbon group which is capable of including hydrogen or fluorine. The p is the integer of 1 to 5. If the p is 2 to 5, a plurality of Qs and REs respectively follows the pre-determined definition. The * is a linkage.</p>
申请公布号 KR20120011815(A) 申请公布日期 2012.02.08
申请号 KR20110073877 申请日期 2011.07.26
申请人 JSR CORPORATION 发明人 ASANO YUSUKE;SATO MITSUO
分类号 G03F7/004;H01L21/027 主分类号 G03F7/004
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