发明名称 TRENCH-FILLING METHOD AND FILM-FORMING SYSTEM
摘要 PURPOSE: A trench-filling method and a film deposition system are provided to prevent oxidation on a silicon film when gas is released by arranging a native oxide film on the surface of the silicon film in beforehand. CONSTITUTION: A pad oxide film(2) is formed by thermally oxidizing the surface of a silicon substrate(1). A silicon nitride film(3) is arranged on the pad oxide film. A photo-resist film(4) is formed by applying photo-resist materials on the silicon nitride film. A trench(6) is formed on the silicon substrate by anisotropic etching of the silicon substrate and the pad oxide film. An oxide film(7) is arranged on the surface of the silicon substrate exposed from the trench.
申请公布号 KR20120011825(A) 申请公布日期 2012.02.08
申请号 KR20110075121 申请日期 2011.07.28
申请人 TOKYO ELECTRON LIMITED 发明人 WATANABE MASAHISA;HASEBE KAZUHIDE
分类号 H01L21/76;H01L21/31 主分类号 H01L21/76
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