发明名称 APPARATUS FOR TESTING A DISPLAY PANEL AND METHOD THEREOF
摘要 PURPOSE: A display panel examination apparatus and method thereof are provided to prevent the degradation of examination accuracy by creating evaluation data by using display defect information. CONSTITUTION: A pattern creation unit(300) provides a test pattern to a display panel for a test. A defect extraction unit(400) extracts display defect information from test image data through a defect extraction algorithm. A control unit(500) creates evaluation data according to the view angle of the display panel for the test by using the display defect information and a capturing angle of a capturing unit(200).
申请公布号 KR20120011546(A) 申请公布日期 2012.02.08
申请号 KR20100073420 申请日期 2010.07.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, BUM SUK;LEE, EUNG SANG;PARK, GI CHANG;KIM, JONG JIN;PARK, CHAN YOUN
分类号 G02F1/13 主分类号 G02F1/13
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