发明名称 |
Surface position detecting apparatus, surface position detecting method, exposure apparatus, and device manufacturing method |
摘要 |
A surface position detecting apparatus which detects position information of a predetermined surface in an object, comprising a first optical system which projects light from an oblique direction to the predetermined surface; a second optical system which receives the light from the object; a detecting system which receives the light from the second optical system and which detects the position information of the predetermined surface in a direction intersecting the predetermined surface based on the light; and a phase difference imparting system which is arranged in an optical path of at least one of the first and second optical systems and which imparts a phase difference between different portions from each other of light traveling via a surface other than the predetermined surface in the object, in the light from the second optical system.
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申请公布号 |
US8111406(B2) |
申请公布日期 |
2012.02.07 |
申请号 |
US20080265572 |
申请日期 |
2008.11.05 |
申请人 |
HIDAKA YASUHIRO;NIKON CORPORATION |
发明人 |
HIDAKA YASUHIRO |
分类号 |
G01B11/14 |
主分类号 |
G01B11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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