发明名称 |
Solid-state imaging device and method for manufacturing the same |
摘要 |
A solid-state imaging device having a high sensitivity and a structure in which a miniaturized pixel is obtained, and a method for manufacturing the solid-state imaging device in which an interface is stable, a spectroscopic characteristic is excellent and which can be manufactured with a high yield ratio. The solid-state imaging device includes at least a silicon layer formed with a photo sensor portion and a wiring layer formed on the front-surface side of the silicon layer, and in which light L is made to enter from a rear-surface side. The thickness of the silicon layer 4 is 10 μm or less. |
申请公布号 |
US8110856(B2) |
申请公布日期 |
2012.02.07 |
申请号 |
US20090548923 |
申请日期 |
2009.08.27 |
申请人 |
MARUYAMA YASUSHI;ABE HIDESHI;MORI HIROYUKI;SONY CORPORATION |
发明人 |
MARUYAMA YASUSHI;ABE HIDESHI;MORI HIROYUKI |
分类号 |
H01L27/14;H01L27/148;H01L21/00;H01L23/00;H01L27/146;H01L29/74;H01L31/00 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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