发明名称 Semiconductor device and method of forming overlapping semiconductor die with coplanar vertical interconnect structure
摘要 A semiconductor device is made by forming first and interconnect structures over a first semiconductor die. A third interconnect structure is formed in proximity to the first die. A second semiconductor die is mounted over the second and third interconnect structures. An encapsulant is deposited over the first and second die and first, second, and third interconnect structures. A backside of the second die is substantially coplanar with the first interconnect structure and a backside of the first semiconductor die is substantially coplanar with the third interconnect structure. The first interconnect structure has a height which is substantially the same as a combination of a height of the second interconnect structure and a thickness of the second die. The third interconnect structure has a height which is substantially the same as a combination of a height of the second interconnect structure and a thickness of the first die.
申请公布号 US8110440(B2) 申请公布日期 2012.02.07
申请号 US20090467865 申请日期 2009.05.18
申请人 BATHAN HENRY D.;CAMACHO ZIGMUND R.;PISIGAN JAIRUS L.;STATS CHIPPAC, LTD. 发明人 BATHAN HENRY D.;CAMACHO ZIGMUND R.;PISIGAN JAIRUS L.
分类号 H01L25/00;H01L23/488 主分类号 H01L25/00
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