发明名称 METHOD FOR PRODUCING SILICON EPITAXIAL WAFER
摘要 <p>The method for producing a silicon epitaxial wafer according to the present invention has: a growth step G at which an epitaxial layer is grown on a silicon single crystal substrate; a first polishing step E at which, before the growth step G, both main surfaces of the silicon single crystal substrate are subjected to rough polishing simultaneously; and a second polishing step H at which, after the growth step G, the both main surfaces of the silicon single crystal substrate are subjected to finish polishing simultaneously.</p>
申请公布号 KR20120011053(A) 申请公布日期 2012.02.06
申请号 KR20117027817 申请日期 2010.05.07
申请人 SUMCO CORPORATION 发明人 ISHIBASHI MASAYUKI;MIURA TOMONORI
分类号 H01L21/20 主分类号 H01L21/20
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