发明名称 |
METHOD FOR MANUFACTURING FREE-STANDING SUBSTRATE, SUBSTRATE AND FREE-STANDING SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To reduce dislocation density on the surface of a joint body in a method capable of obtaining a joint body of group III nitride semiconductor crystals by growing a group III nitride semiconductor crystal on a base substrate having pieces of group III nitride semiconductor crystal adjacently arranged each other to join the group III nitride semiconductor crystals grown from each piece of the crystals.SOLUTION: A method for manufacturing a free-standing substrate comprises: a mask formation step S10 of covering a boundary part between adjacent crystal pieces on a first surface of a base substrate formed by arranging two or more pieces of group III nitride semiconductor crystal to expose a portion without having the boundary part and forming a mask including an insulation layer; and a growth step S20 of growing a group III nitride semiconductor from the exposed portion of the base substrate to form a group III nitride semiconductor layer.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016155706(A) |
申请公布日期 |
2016.09.01 |
申请号 |
JP20150034266 |
申请日期 |
2015.02.24 |
申请人 |
FURUKAWA CO LTD |
发明人 |
MATSUEDA TOSHIHARU;ISHIHARA YUJIRO |
分类号 |
C30B29/38;C30B25/20 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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