发明名称 PHOTOLUMINESCENCE MEASUREMENT TOOL AND ASSOCIATED METHOD
摘要 <p>The invention relates to a photoluminescence measurement tool, and an associated method and measurement system for probing the electronic structure of semiconductor materials. The tool or system may be integrated into a photovoltaic module manufacturing process.</p>
申请公布号 WO2012016233(A1) 申请公布日期 2012.02.02
申请号 WO2011US46087 申请日期 2011.08.01
申请人 FIRST SOLAR, INC.;ALLENIC, ARNOLD;BACON, DOUGLAS;BULLER, BENYAMIN;CHRISTIANSEN, JOHN;MILSHTEIN, EREL;REGEV, AVNER;SANKIN, IGOR 发明人 ALLENIC, ARNOLD;BACON, DOUGLAS;BULLER, BENYAMIN;CHRISTIANSEN, JOHN;MILSHTEIN, EREL;REGEV, AVNER;SANKIN, IGOR
分类号 G01N21/64;G01N21/88;G01N21/89;G01N21/95;H01L21/66;H01L31/18 主分类号 G01N21/64
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