发明名称 PROPERTY MEASURING METHOD AND PROPERTY MEASURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To efficiently obtain the electric power-entire light property of a light source. <P>SOLUTION: A property measuring apparatus 100 having a first box body 101 with a reflective surface part 113 on which light is regularly reflected, a second box body 102 with an absorbing surface part 123 for absorbing light, and detection means 103 for detecting the reflective light amount which is light amount obtained by the first box body 101 and the direct light amount obtained by the second box body 102 is used to measure a plurality of reflective light amounts by using the first box body 101 to provide the light source 300 with a plurality of different electric powers and to use the second box body to provide the light source 300 with a plurality of different electric powers to measure a plurality of direct light amounts, thereby calculate the electric power-entire light property of the light source 300 based on the plurality of reflective light amounts and the plurality of direct light amounts measured. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012021957(A) 申请公布日期 2012.02.02
申请号 JP20100162181 申请日期 2010.07.16
申请人 PANASONIC CORP 发明人 YAMANAKA KAZUHIKO;HIROTA MAKI
分类号 G01M11/00 主分类号 G01M11/00
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