| 摘要 |
Provided is a small and light weight X-ray diffraction device which does not require a goniometer. Specifically provided is an X-ray diffraction device equipped with: a first X-ray irradiation means for irradiating the surface of a sample with a formed X-ray from a first direction; a second X-ray irradiation means for irradiating the region on the surface of the sample, which was irradiated with the X-ray from the first X-ray irradiation means, with a second formed X-ray from a second direction; an X-ray detection means for detecting a first diffraction X-ray generated from the region on the sample irradiated with the X-ray from the first X-ray irradiation means and a second diffraction X-ray generated from the region on the sample irradiated with the X-ray from the second X-ray irradiation means; and an X-ray diffraction signal processing means for processing the signal obtained by detecting, by means of the X-ray detection means, the first diffraction X-ray and the second diffraction X-ray which were generated from the same region of the sample. |
