SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, CONTROL METHOD THEREFOR AND INFORMATION PROCESSING APPARATUS

摘要

When a scan storage element group in which a plurality of scan storage elements are connected in series is scanned to collect data, the determination as to whether the collected data is correct or erroneous can easily be performed. There are included a scan storage element group (6) in which a plurality of stages of scan storage elements are connected in series; an end code register (82) which is disposed between an input terminal and the input side of the scan storage element group (6) and which holds an end code; and a start code register (80) which is disposed between an output terminal and the output side of the scan storage element group (6) and which holds a start code. The scan storage element group (6), end code register (82) and start code register (80) are caused to perform shift operations, thereby outputting scan data at the output terminal.