| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test device and a test method with which the increase of temperature of a semiconductor device can be suppressed and test can be performed in short time without using any large scale cooling means even if a semiconductor device to be tested is a semiconductor device of high power. <P>SOLUTION: A test device 20 for performing test with respect to a semiconductor device 30 having a plurality of functional blocks 31 to 34 which are independently operated has a temperature detection part 22 for measuring the temperature of the semiconductor device and a switching part 21 for switching the number of the functional blocks performing test in parallel from a plurality of functional blocks based on the temperature detected by the temperature detection part. <P>COPYRIGHT: (C)2012,JPO&INPIT |
