发明名称 THERMAL EMISSIVITY MEASURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a thermal emissivity measuring apparatus capable of measuring thermal emissivity accurately and easily. <P>SOLUTION: A thermal emissivity measuring apparatus comprises: a radiation sensor which is installed at a position isolated from the surface of a sample by a prescribed distance and can measure only thermal energy by thermal radiation incident on the incidence plane from the sample excluding thermal conduction and thermal convection; a heating part which heats the sample; a first temperature measurement part which measures the temperature of the sample; and a second temperature measurement part which measures the temperature of the radiation sensor. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012021955(A) 申请公布日期 2012.02.02
申请号 JP20100162136 申请日期 2010.07.16
申请人 SONY CORP 发明人 KITAMURA SHIGERU;TODA AKIRA
分类号 G01J5/00 主分类号 G01J5/00
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