| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a signal output device and a semiconductor testing device using the same, which can reduce power consumption, size, and cost. <P>SOLUTION: A signal output device comprises: a first D/A converter for generating a high-level side set voltage for an output signal output from a driver; a positive-side power supply part for supplying a positive-side power supply voltage, which is obtained by adding a positive-side bias voltage to the high-level side set voltage, to a positive-side power supply terminal of the driver; a second D/A converter for generating a low-level side set voltage for the output signal output from the driver; a negative-side power supply part for supplying a negative-side power supply voltage, which is obtained by subtracting a negative-side bias voltage from the low-level side set voltage, to a negative-side power supply terminal of the driver; a control part for setting the high-level side set voltage to the first D/A converter, setting the positive-side power supply voltage to the positive-side power supply part, setting the low-level side set voltage to the second D/A converter, and setting the negative-side power supply voltage to the negative-side power supply part. <P>COPYRIGHT: (C)2012,JPO&INPIT |
