| 摘要 |
<P>PROBLEM TO BE SOLVED: To delay a test signal according to the latency of a tested device. <P>SOLUTION: There is provided a test device for testing a tested device including: a pattern conversion part for generating pattern data of a test signal to be input to the tested device and pattern timing data showing each edge timing of a test signal by a resolution smaller than a fundamental period in synchronization with a fundamental period by converting an input pattern to be input thereinto; and a data delay part for delaying the pattern data generated by the pattern conversion part corresponding to a variable setting value of integer times of the fundamental period; and a waveform generation part for generating a test signal having a waveform corresponding to the pattern data and pattern timing data delayed by the data delay part to input it into the tested device. <P>COPYRIGHT: (C)2012,JPO&INPIT |
