发明名称 RESIN SEAL TYPE SEMICONDUCTOR DEVICE FORMATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a resin seal type semiconductor device formation method which can encapsulate a semiconductor device with a resin while preventing occurrence of cracks reaching the semiconductor device. <P>SOLUTION: In a space between a semiconductor device 10 and presser foot pins 43, a first resin material 44 having quality same as that of an encapsulation resin is used at portions contacting the semiconductor device 10, and a second resin material 45 of a melting point higher than that of the encapsulation resin is used at portions contacting the presser foot pins 43. In this state, the semiconductor device 10 is pressed by the presser foot pins 43. The encapsulation resin is infused into a cavity 50 to encapsulate the semiconductor device 10 with the first resin material 44 being integrated with the encapsulation resin. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012023130(A) 申请公布日期 2012.02.02
申请号 JP20100158725 申请日期 2010.07.13
申请人 TOYOTA INDUSTRIES CORP 发明人 KAYANO KAZUO;OKAMOTO KOJI
分类号 H01L21/56 主分类号 H01L21/56
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