发明名称 |
ACTINIC RAY SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING PATTERN USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an actinic ray sensitive or radiation sensitive resin composition that can satisfy both excellent developing property and excellent followability of immersion liquid and to provide a method for forming pattern using the composition. <P>SOLUTION: An actinic ray sensitive or radiation sensitive resin composition according to the present invention is a resin (B) having at least one of fluorine atom and silicon atom and includes a resin (B) including a repeating unit expressed by the following formula (I); a resin (A) whose solubility in an alkali developing solution is increased by an action of an acid; and a compound which generates an acid upon irradiation with actinic ray or radiation. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012022100(A) |
申请公布日期 |
2012.02.02 |
申请号 |
JP20100159093 |
申请日期 |
2010.07.13 |
申请人 |
FUJIFILM CORP |
发明人 |
IIZUKA YUSUKE;SHIBUYA AKINORI;TAKAHASHI HIDETOMO;FUKUHARA TOSHIAKI;KOSHIJIMA KOSUKE |
分类号 |
G03F7/039;C08F12/04;C08F22/12;C08F22/36;G03F7/004;G03F7/38;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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