发明名称 DEVICE FOR MEASURING DEFORMED STATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a device which instantaneously measures a deformed state under a situation where the whole object to be measured is pressurized as shape data and distribution pressure data. <P>SOLUTION: A device for measuring a deformed state composes: a base 40; a surface pressure sheet 10 mounted on the upper part of the base 40; a plurality of probe pins 20 mounted on the upper part of the surface pressure sheet 10; and a plurality of guide cylinders 30 which are mounted so as to cover the plurality of the probe pins 20, respectively. The probe pin 20 composes: a lower side pin 22; a probe cup 24 disposed so as to cover the lower side pin 22; and an elastic body disposed so as to be pinched between the lower side pin 22 and the probe cup 24. The surface pressure sheet 10 and the lower side pin 22 are in contact with each other. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012021924(A) 申请公布日期 2012.02.02
申请号 JP20100161338 申请日期 2010.07.16
申请人 NISHIZAWA YOSHIJI 发明人 NISHIZAWA YOSHIJI
分类号 G01B5/20;G01L5/00 主分类号 G01B5/20
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