发明名称 LOW SCHOTTKY BARRIER SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
摘要 A low Schottky barrier semiconductor structure is provided, comprising: a substrate; a SiGe layer with low Ge content formed on the substrate; a channel layer with high Ge content formed on the SiGe layer; a gate stack formed on the substrate and a side wall of one or more layers formed on both sides of the gate stack; a metal source and a metal drain formed in the channel layer and on the both sides of the gate stack respectively; and an insulation layer formed between the substrate and the metal source and between the substrate and the metal drain respectively.
申请公布号 US2012025279(A1) 申请公布日期 2012.02.02
申请号 US201113132760 申请日期 2011.05.10
申请人 WANG JING;WANG WEI;GUO LEI;XU JUN;TSINGHUA UNIVERSITY 发明人 WANG JING;WANG WEI;GUO LEI;XU JUN
分类号 H01L29/812;H01L21/338 主分类号 H01L29/812
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