发明名称 MOS Type Semiconductor Device and Method of Manufacturing Same
摘要 An object of the present invention is to provide a MOS type semiconductor device allowing production at a low cost without lowering a breakdown voltage and avoiding increase of an ON resistance. A MOS type semiconductor device of the invention comprises: a p base region having a bottom part in a configuration with a finite radius of curvature and selectively disposed on a front surface region of a n− drift layer; an n type first region selectively disposed on a front surface region of the p base region; a gate electrode disposed on a part of the surface of the p base region between a surface of the n type first region and a front surface of the n− drift layer interposing a gate insulation film between the part of the surface of the p base region and the gate electrode; and a metal electrode in electrically conductive contact with the front surface of the n type first region and the central part of the surface of the p base region; wherein a pn junction surface between the base region and the drift layer has centers of curvature both at the outside and inside of the base region.
申请公布号 US2012025262(A1) 申请公布日期 2012.02.02
申请号 US201113195516 申请日期 2011.08.01
申请人 NIIMURA YASUSHI;FUJI ELECTRIC CO., LTD. 发明人 NIIMURA YASUSHI
分类号 H01L29/78;H01L21/266;H01L29/739 主分类号 H01L29/78
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