发明名称 POLISHING METHOD, POLISHING APPARATUS AND GAN WAFER
摘要 <p>A polishing method can process and flatten, in a practical processing time and with high surface accuracy, a surface of a substrate of a Ga element-containing compound semiconductor. The polishing method includes: bringing a Ga element-containing compound semiconductor substrate (16) into contact with a polishing tool (10) in the presence of a processing solution (14) comprising a neutral pH buffer solution containing Ga ions; irradiating a surface of the substrate with light or applying a bias potential to the substrate, or applying a bias potential to the substrate while irradiating the surface of the substrate with light, thereby forming Ga oxide (16a) on the surface of the substrate; and simultaneously moving the substrate and the polishing tool relative to each other to polish and remove the Ga oxide formed on the surface of the substrate.</p>
申请公布号 EP2412009(A1) 申请公布日期 2012.02.01
申请号 EP20100756259 申请日期 2010.03.19
申请人 OSAKA UNIVERSITY;EBARA CORPORATION 发明人 SANO, YASUHISA;YAMAUCHI, KAZUTO;MURATA, JUNJI;SADAKUNI, SHUN;YAGI, KEITA
分类号 H01L21/304;B24B37/00 主分类号 H01L21/304
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