发明名称 Functionalized fullerenes for nanolithography applications
摘要 A method for electron beam nanolithography without the need for development step involves depositing a film of a resist comprising functionalized fullerenes on a substrate, and writing features by exposure to an electron beam with an accelerating voltage and dose rate sufficient to promote heating or thermal degradation of the functionalized fullerene in the irradiated volume such that a pattern is generated without a subsequent development step or with an aqueous developer. Lithographic features of about 1 nm or greater can be formed.
申请公布号 US8105754(B2) 申请公布日期 2012.01.31
申请号 US20090810241 申请日期 2009.01.05
申请人 SINGH AMIT KUMAR;KRISHNA VIJAY;MOUDGIL BRIJ M.;KOOPMAN BENJAMIN L.;UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC. 发明人 SINGH AMIT KUMAR;KRISHNA VIJAY;MOUDGIL BRIJ M.;KOOPMAN BENJAMIN L.
分类号 G03C5/00 主分类号 G03C5/00
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