发明名称 Process for fabricating silicon-on-nothing MOSFETs
摘要 A semiconductor device includes a gate stack; an air-gap under the gate stack; a semiconductor layer vertically between the gate stack and the air-gap; and a first dielectric layer underlying and adjoining the semiconductor layer. The first dielectric layer is exposed to the air-gap.
申请公布号 US8106468(B2) 申请公布日期 2012.01.31
申请号 US20080143612 申请日期 2008.06.20
申请人 WANG TA-WEI;CHANG CHIH-SHENG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WANG TA-WEI;CHANG CHIH-SHENG
分类号 H01L21/764 主分类号 H01L21/764
代理机构 代理人
主权项
地址