发明名称 Nonvolatile memory device using a variable resistive element
摘要 A nonvolatile memory device includes a plurality of memory banks, each including a plurality of nonvolatile memory cells, write global bit lines shared by the plurality of memory banks, read global bit lines shared by the plurality of memory banks, and a dummy global bit line arranged between the write global bit lines and the read global bit lines, wherein the dummy global bit line is configured and operable to reduce noise affecting a write bit line involved in a write operation or noise affecting a read global bit line involved in a read operation.
申请公布号 US8107284(B2) 申请公布日期 2012.01.31
申请号 US20090630317 申请日期 2009.12.03
申请人 CHOI BYUNG-GIL;SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI BYUNG-GIL
分类号 G11C11/00 主分类号 G11C11/00
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