发明名称 Liquid composition for removing photoresist residue and polymer residue
摘要 Provided is a liquid composition for, at a low temperature in a short time, removing a photoresist residue and a polymer residue generated in a semiconductor circuit element manufacturing process A residue removing method using such composition is also provided. The composition removes the photoresist residue and/or the polymer residue generated in the manufacturing process of a semiconductor circuit element having a metal wiring. The composition includes a fluorine compound of 0.5-3.0 mass % and water not over 30 mass %, and has a pH of 4 or less.
申请公布号 US8105998(B2) 申请公布日期 2012.01.31
申请号 US20070311951 申请日期 2007.10.24
申请人 OHWADA TAKUO;KANTO KAGAKU KABUSHIKI KAISHA 发明人 OHWADA TAKUO
分类号 C11D7/08 主分类号 C11D7/08
代理机构 代理人
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