发明名称 N-CHANNEL ESD CLAMP WITH IMPROVED PERFORMANCE
摘要 An electrostatic discharge (ESD) protection circuit uses two N-channel field effect transistors (NFETs) to conduct ESD current from a first to a second supply node. During the ESD event, an ESD detection circuit couples the gates of both NFETs to the first supply node through separate conductive paths. In one novel aspect, an RC trigger circuit includes a capacitance that is charged through a resistance. The resistance involves a P-channel transistor whose gate is coupled to the gate of the second NFET. During a normal power-up condition, the P-channel transistor is conductive, thereby preventing the RC trigger from triggering if the supply voltage VDD were to rise rapidly. In another novel aspect, a novel level-shifting inverter drives the second NFET. The level-shifting inverter uses a pull down resistor to avoid snap-back and also isolates the gate of the second NFET from a capacitively loaded third supply node.
申请公布号 KR101109283(B1) 申请公布日期 2012.01.31
申请号 KR20097006027 申请日期 2007.08.24
申请人 发明人
分类号 H03K19/003;H01L27/04 主分类号 H03K19/003
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