发明名称 METHOD FOR ARRANGING FINE PARTICLES ON SUBSTRATE BY PHYSICAL PRESSURE
摘要 <p>PURPOSE: A fine particle arranging method by physical pressure is provided to align fine particles of a single layer or multilayer on a substrate with a wide area. CONSTITUTION: A first substrate is prepared. A first intaglio print or first embossing print is arranged for fixing the orientation and/or location of fine particles on the surface of the first substrate. A plurality of fine particles is placed on the first substrate. A part or all of the fine particles are inserted into an air gap arranged by the first intaglio print or first embossing print. The fine particles are aligned on the first substrate by physical pressure.</p>
申请公布号 KR20120009484(A) 申请公布日期 2012.01.31
申请号 KR20117026434 申请日期 2010.04.09
申请人 INDUSTRY-UNIVERSITY COOPERATION FOUNDATION SOGANGUNIVERSITY 发明人 YOON, KYUNG BYUNG;NGUYEN NGUYEN KHANH;PHAM CAO THANH TUNG
分类号 H01L21/20 主分类号 H01L21/20
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