发明名称 Method for fabricating asymmetric double-gate transistors by which asymmetric and symmetric double-gate transistors can be made on the same substrate
摘要 A method for fabricating a microelectronic device with one or plural asymmetric double-gate transistors, including: a) forming one or plural structures on a substrate including at least a first semiconducting block configured to form a first gate of a double-gate transistor, and at least a second semiconducting block configured to form a second gate of the double-gate transistor, the first block and the second block being located on opposite sides of at least one semiconducting zone and separated from the semiconducting zone by a first gate dielectric zone and a second gate dielectric zone respectively, and b) doping at least one or plural semiconducting zones in the second block of at least one given structure among the structures, using at least one implantation selective relative to the first block.
申请公布号 US8105906(B2) 申请公布日期 2012.01.31
申请号 US20070521377 申请日期 2007.12.28
申请人 VINET MAUD;THOMAS OLIVIER;ROZEAU OLIVIER;POIROUX THIERRY;COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 VINET MAUD;THOMAS OLIVIER;ROZEAU OLIVIER;POIROUX THIERRY
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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