发明名称 SOLAR CELL MARKING METHOD, AND SOLAR CELL
摘要 <p>The invention relates to a solar-cell marking method comprising the steps of: providing a substrate with a substrate surface for producing a solar cell (1) that comprises an active zone (5); and producing at least one indentation (21, 31) in the substrate surface with the use of laser irradiation, wherein the at least one indentation (21, 31) forms a marking (2, 3) for marking the solar cell (1), and producing the indentation (21, 31) is carried out prior to carrying out a solar-cell manufacturing process or during carrying out a solar-cell manufacturing process. According to the invention the substrate is designed as a semiconductor wafer with a wafer surface, and the marking (2, 3) is positioned on the wafer surface such that the marking (2, 3) is in the active zone (5) of the solar cell (1) formed by the semiconductor wafer. Furthermore, the invention relates to a semiconductor-wafer solar cell (1) whose marking is easily recognizable and thus positioned so as to be reliably readable, without this impeding the functionality of the solar cell (1).</p>
申请公布号 KR101110467(B1) 申请公布日期 2012.01.31
申请号 KR20087022418 申请日期 2007.02.28
申请人 发明人
分类号 H01L23/544;H01L21/02;H01L31/02;H01L31/04 主分类号 H01L23/544
代理机构 代理人
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