发明名称 Defect review apparatus and method of reviewing defects
摘要 A review apparatus for reviewing a specimen by moving the specimen to pre-calculated coordinate includes: a function to measure a deviation amount between the pre-calculated coordinates and coordinates of an actual position of the specimen; a function to optimize a coordinate correcting expression to minimize the measured deviation amount; and a function to determine that the deviation amounts have converged. When the deviation amounts have converged, the measurement for the coordinate-correcting-expression optimization is terminated, and a field of view necessary for the specimen to be within the field of view is set according to a convergence value of the calculated deviation amount.
申请公布号 US8108172(B2) 申请公布日期 2012.01.31
申请号 US20100953170 申请日期 2010.11.23
申请人 HIRAI TAKEHIRO;OBARA KENJI;YAMAGUCHI KOHEI;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 HIRAI TAKEHIRO;OBARA KENJI;YAMAGUCHI KOHEI
分类号 G01C17/38;G01N21/86;G01N23/225 主分类号 G01C17/38
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