The invention relates to a strain gauge, comprising an arrangement of carbon nanotubes on a substrate, wherein the carbon nanotubes have a uniform orientation so that a strain of the strain gauge in a direction perpendicular to the orientation of the carbon nanotubes results in a change in the electrical conductance of the arrangement of carbon nanotubes in the direction perpendicular to the orientation of the carbon nanotubes, which change can be measured by means of the strain gauge. The aim of providing an improved strain gauge that enables particularly high measuring accuracy is solved for a generic strain gauge in that a means for compensating the temperature coefficients of the electrical conductance of the arrangement of carbon nanotubes in the direction perpendicular to the orientation of the carbon nanotubes is provided. The invention further relates to a precision measuring device having such a strain gauge. The invention further relates to a method for producing such a strain gauge.
