发明名称 PHOTOELECTROCHEMICAL ETCHING OF P-TYPE SEMICONDUCTOR HETEROSTRUCTURES
摘要 A method for photoelectrochemical (PEC) etching of a p-type semiconductor layer simply and efficiently, by providing a driving force for holes to move towards a surface of a p-type cap layer to be etched, wherein the p-type cap layer is on a heterostructure and the heterostructure provides the driving force from an internal bias generated internally in the heterostructure; generating electron-hole pairs in a separate area of the heterostructure than the surface to be etched; and using an etchant solution to etch the surface of the p-type layer.
申请公布号 US2012018853(A1) 申请公布日期 2012.01.26
申请号 US201113247866 申请日期 2011.09.28
申请人 TAMBOLI ADELE;HU EVELYN LYNN;SCHMIDT MATHEW C.;NAKAMURA SHUJI;DENBAARS STEVEN P.;THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 TAMBOLI ADELE;HU EVELYN LYNN;SCHMIDT MATHEW C.;NAKAMURA SHUJI;DENBAARS STEVEN P.
分类号 H01L29/06;H01L21/306 主分类号 H01L29/06
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