发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a semiconductor device includes implanting indium into a first region of a semiconductor substrate; forming a first gate insulation film having a first film thickness in the first region and a second region different from the first region after the implanting; removing the first gate insulation film from the first region; applying heat treatment to the semiconductor substrate after the forming; and forming a second gate insulation film having a second film thickness on the first region after the applying. In the method, a temperature falling rate of the heat treatment in the applying is 20° C. per second or higher.
申请公布号 US2012021593(A1) 申请公布日期 2012.01.26
申请号 US201113160460 申请日期 2011.06.14
申请人 HORI MITSUAKI;YOSHIZAWA KAZUTAKA;FUJITSU SEMICONDUCTOR LIMITED 发明人 HORI MITSUAKI;YOSHIZAWA KAZUTAKA
分类号 H01L21/265 主分类号 H01L21/265
代理机构 代理人
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