发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having excellent breakdown voltage performance with a low-potential area and high-potential wiring not being crossed. <P>SOLUTION: The semiconductor device of the present invention comprises: a logic circuit (501); a low-potential side drive circuit (502) for driving a low-potential side power element in response to a control signal from the logic circuit; a high-potential side drive circuit (505) to which a control signal from the logic circuit is input via a level shift circuit for driving a high-potential side power element (506); and a multiple trench separation region (508) for separating a high-potential island including the high-potential side power element by a multiply overlapped trench separation region. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012019227(A) 申请公布日期 2012.01.26
申请号 JP20110190571 申请日期 2011.09.01
申请人 MITSUBISHI ELECTRIC CORP 发明人 SHIMIZU KAZUHIRO
分类号 H01L27/08;H01L21/3205;H01L21/822;H01L21/8234;H01L23/52;H01L27/04;H01L27/06;H01L29/06;H01L29/41;H01L29/786;H01L29/861 主分类号 H01L27/08
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