| 摘要 |
<P>PROBLEM TO BE SOLVED: To accelerate an ADC of a single slope type while suppressing the deterioration of an image quality in the case of a small signal level. <P>SOLUTION: A solid-state imaging device is provided with a pixel PC, a reference ramp generation circuit 6; and a column ADC circuit 3. The pixel PC outputs a signal subjected to photo-electric conversion. The reference ramp generation circuit 6 generates a first ramp wave Vramp U and a second ramp wave Vramp L smaller in step width than the first ramp wave Vramp U. The column ADC circuit 3 switches between the first ramp wave Vramp U and the second ramp wave Vramp L according to the signal level of a signal output from the pixel PC and thereafter compares the result with the signal level, thereby detecting the signal components of the pixel PC by a CDS. <P>COPYRIGHT: (C)2012,JPO&INPIT |
