发明名称 MASK PROCESSING USING FILMS WITH SPATIALLY SELECTIVE BIREFRINGENCE REDUCTION
摘要 Certain patternable reflective films are used as masks to make other patterned articles, and one or more initial masks can be used to pattern the patternable reflective films. An exemplary patternable reflective film has an absorption characteristic suitable to, upon exposure to a radiant beam, absorptively heat a portion of the film by an amount sufficient to change a first reflective characteristic to a different second reflective characteristic. The change from the first to the second reflective characteristic is attributable to a change in birefringence of one or more layers or materials of the patternable film. In a related article, a mask is attached to such a patternable reflective film. The mask may have opaque portions and light-transmissive portions. Further, the mask may have light-transmissive portions with structures such as focusing elements and/or prismatic elements.
申请公布号 WO2012012177(A1) 申请公布日期 2012.01.26
申请号 WO2011US42368 申请日期 2011.06.29
申请人 3M INNOVATIVE PROPERTIES COMPANY;MERRILL, WILLIAM WARD;DUNN, DOUGLAS S. 发明人 MERRILL, WILLIAM WARD;DUNN, DOUGLAS S.
分类号 G02B5/30;B42D15/10;G02B5/28 主分类号 G02B5/30
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