发明名称 DEVICE AND SYSTEM FOR MEASURING MATERIAL THICKNESS
摘要 A piezoelectric sensing device is described for measuring material thickness of target such as pipes, tubes, and other conduits that carry fluids. The piezoelectric sensing device comprises a substrate such as a flexible circuit material, a piezoceramic element, and a solder layer disposed therebetween. These features are arranged in manner that provides a low-profile measurement device suitable for high-temperature applications such as those applications in which the temperature exceeds 120° C. Embodiments of the piezoelectric sensing device can be configured for use as stand-alone units separately located on the target or for use as a string of sensing elements coupled together by way of the flexible circuit material.
申请公布号 US2012019105(A1) 申请公布日期 2012.01.26
申请号 US20100840485 申请日期 2010.07.21
申请人 KROHN MATTHEW;MEYER PAUL ALOYSIUS;BARSHINGER JAMES NORMAN;FAN YING;MATTHEWS FRED;SMITH NATHAN 发明人 KROHN MATTHEW;MEYER PAUL ALOYSIUS;BARSHINGER JAMES NORMAN;FAN YING;MATTHEWS FRED;SMITH NATHAN
分类号 H01L41/04 主分类号 H01L41/04
代理机构 代理人
主权项
地址