| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a probe unit that enables, while being compatible with a fine (narrow) pitch by itself, measurement by a four-terminal pair process as required. <P>SOLUTION: A probe unit for circuit board checkup comprises a pin block 120 having a plurality of probe pins 122 and a test head unit 110 arranged over the pin block 120 and having electric wiring 112 inside for connecting each probe pin 122 to a checkup unit of a circuit board checkup device. Out of the probe pins 112, two current probe pins P1 and P2 and two voltage probe pins P3 and P4 are selected as probe pins for a four-terminal pair process; four coaxial cables C1 to C4 are led into the test head unit 110 as electric wiring for the two current probe pins P1 and P2 and the two voltage probe pins P3 and P4; and all external conductors S of the coaxial cables are electrically connected and short-circuited within the test head unit 110 by a conductor pattern 113 by the four-terminal pair process. <P>COPYRIGHT: (C)2012,JPO&INPIT |
