发明名称 High frequency measuring probe
摘要 <p>A test prod for high-frequency measurement having a contact-side end for electrically contacting planar structures and a cable-side end, for connecting to a cable, wherein between the contact-side end and the cable-side end a coplanar conductor structure having at least two conductors is arranged, wherein on the coplanar conductor structure a dielectric is arranged over a predetermined section between the cable-side end and the contact-side end, wherein the test prod is between the dielectric and the contact-side end such that the conductors of the coplanar conductor structure are arranged freely in space and relative to the dielectric in a suspending manner, wherein on one side of the test prod facing towards the planar structure a shielding element is arranged extending into the area of the coplanar conductor structure.</p>
申请公布号 EP2409166(A1) 申请公布日期 2012.01.25
申请号 EP20100707465 申请日期 2010.03.01
申请人 ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG 发明人 THIES, STEFFEN
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
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