首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
WAFER DEFECT DETECTION SYSTEM WITH TRAVELING LENS MULTI-BEAM SCANNER
摘要
申请公布号
KR101108353(B1)
申请公布日期
2012.01.25
申请号
KR20107024438
申请日期
2003.03.14
申请人
发明人
分类号
G01B11/30;H01L21/66;G01B11/25;G01N21/00;G01N21/89;G01N21/95;G01N21/956
主分类号
G01B11/30
代理机构
代理人
主权项
地址
您可能感兴趣的专利
IMPROVED PROCESS FOR PREPARING MICRONIZED POLYPEPTIDE DRUGS
ROTOR FOR SYNCHRONOUS MOTOR
HOLDER FOR INSERTS FOR SLOT MILLING CUTTERS
Shipping container, especially for data medium
RECOILLESS PROJECTILE LAUNCHER
HERMAPHRODITIC GEL CLOSURE
Method for inspecting the continuity of the longitudinal bars of multiple chamber hollow profiles
Fremgangsmåte ved fremstilling av doseringsform for tilföring av biologisk aktivt materiale til fisk
Vehicle traction control system
A 2-D monolithic coherent semiconductor laser array
Fremgangsmåte for å tilveiebringe en forbedret forbrenning i forbrenningsprosesser inneholdende hydrokarbonforbindelser
PROCESS AND DEVICE FOR RELINING SERVICE DRAINS JOINED TO INACCESSIBLE MAIN SEWAGE DRAINS
PEROXOACID MANUFACTURE
Device for protection against theft, for example of an automobile
SEALING DEVICES FOR RECTILINEARLY MOVING MECHANISM AND METHOD OF MANUFACTURING SAME
Process for making a contact carrying blade of a switch by cutting a band and blade made by this process
Amplifier arrangement
Maximum likelihood sequence estimation for rapidly varying mobile radio communication channels
Pregna-21-oic acid esters
Delivering nozzle for media
