发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent a crack or defect by reducing stress applied to a nitride layer for an NFC(Nitride Floating Cap). CONSTITUTION: A nitride layer for an NFC(Nitride Floating Cap) and a first sacrificial insulation layer are formed on a semiconductor substrate. An etch stopping layer is formed between the semiconductor substrate and the first sacrificial insulation layer. A lower electrode region is formed by etching a first sacrificial insulation layer and a nitride layer for the NFC until the semiconductor substrate is exposed. A lower electrode(160) is formed on the lower electrode region. A division region(130') is formed by etching the nitride layer for the NFC.
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申请公布号 |
KR20120007703(A) |
申请公布日期 |
2012.01.25 |
申请号 |
KR20100068366 |
申请日期 |
2010.07.15 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
WOO, JAI YONG;CHANG, DONG IN |
分类号 |
H01L21/8242;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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