发明名称 Semiconductor integrated circuit device
摘要 A method of fabricating a semiconductor integrated circuit includes forming a first dielectric layer on a semiconductor substrate, patterning the first dielectric layer to form a first patterned dielectric layer, forming a non-single crystal seed layer on the first patterned dielectric layer, removing a portion of the seed layer to form a patterned seed layer, forming a second dielectric layer on the first patterned dielectric layer and the patterned seed layer, removing portions of the second dielectric layer to form a second patterned dielectric layer, irradiating the patterned seed layer to single-crystallize the patterned seed layer, removing portions of the first patterned dielectric layer and the second patterned dielectric layer such that the single-crystallized seed layer protrudes in the vertical direction with respect to the first and/or the second patterned dielectric layer, and forming a gate electrode in contact with the single-crystal active pattern.
申请公布号 US8101509(B2) 申请公布日期 2012.01.24
申请号 US201113025011 申请日期 2011.02.10
申请人 SON YONG-HOON;CHOI SI-YOUNG;LEE JONG-WOOK;SAMSUNG ELECTRONICS CO., LTD. 发明人 SON YONG-HOON;CHOI SI-YOUNG;LEE JONG-WOOK
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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