发明名称 Inspection apparatus and inspection method
摘要 A defect inspection apparatus enable to efficiently perform a temperature control without involving an enlarged size can be achieved. The parts constituting the defect inspection apparatus are classified into parts need temperature control and parts not to need temperature control; all the parts need temperature control are accommodated together into a temperature-controlled part accommodating section 604, and the parts not to need temperature control are arranged in a heat radiating unit 605. The temperature in the temperature-controlled part accommodating section 604 is measured by a temperature measuring instrument 603 and a control CPU 602 in a temperature control unit 601 carries out control according to the measured temperature so that the interior of the temperature-controlled part accommodating section 604 is kept at a fixed temperature. Therefore, it becomes easy to keep the fixed temperature, when compared with a case in which individual parts are temperature-controlled separately by being heated or cooled, yielding an energy saving effect.
申请公布号 US8102522(B2) 申请公布日期 2012.01.24
申请号 US20070989018 申请日期 2007.06.29
申请人 SUGA TADASHI;CHIKAMATSU SHUICHI;OCHI MASAYUKI;SUZUKI TAKAHIKO;OTANI SEIJI;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 SUGA TADASHI;CHIKAMATSU SHUICHI;OCHI MASAYUKI;SUZUKI TAKAHIKO;OTANI SEIJI
分类号 G01N21/00 主分类号 G01N21/00
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