发明名称 |
Method And System For Performing Self-Tests In An Electronic System |
摘要 |
A method and system for performing a self-test of power supply quality for an integrated circuit chip within an electronic system. The electronic system is subjected to a well-defined repetitive activity, such as by using an amplitude modulated system clock tree. With the repetitive activity causing current consumption within the chip, time-domain local power supply voltage (U(t)) is measured for a location on the chip. A set of time-domain measured voltage data (U(t)) is accumulated and transformed into the frequency domain to yield a local voltage profile (U(f)). The local voltage profile (U(f)) is compared with a reference voltage profile (U0(f)) to verify whether power supply quality at the chip location under test is adequate. Alternatively, a local impedance profile Z(f) evaluated from the local voltage profile (U(f)) may be compared to a reference impedance profile Z0(f).
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申请公布号 |
US2012013356(A1) |
申请公布日期 |
2012.01.19 |
申请号 |
US201113087550 |
申请日期 |
2011.04.15 |
申请人 |
ECKERT MARTIN;FRECH ROLAND;SUPPER JOCHEN;TORREITER OTTO A.;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ECKERT MARTIN;FRECH ROLAND;SUPPER JOCHEN;TORREITER OTTO A. |
分类号 |
G01R31/3187 |
主分类号 |
G01R31/3187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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