发明名称 FUSE TEST CIRCUIT
摘要 PURPOSE: A fuse test circuit is provided to determine whether a fuse circuit is normal by comparing a fuse resistor included in the fuse circuit with a fuse resistor set in a system. CONSTITUTION: A fuse test circuit includes a fuse resistor, a comparator(100), and a determining unit(200). The comparator compares the fuse resistor with a first reference resistor and a second reference resistor. The determining unit receives fuse data of the fuse resistor stored in the system and outputs a signal for determining whether the fuse resistor is normal according to the fuse data and the output signal of the comparator.
申请公布号 KR20120006706(A) 申请公布日期 2012.01.19
申请号 KR20100067320 申请日期 2010.07.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, CHANG YEOL
分类号 G11C29/04;G11C29/10 主分类号 G11C29/04
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