发明名称 |
MEASURING METHOD FOR REFLECTIVITY CURVE OF X-RAY AND OF NEUTRON RADIATION, AND MEASURING INSTRUMENT |
摘要 |
<P>PROBLEM TO BE SOLVED: To measure a reflectivity curve of X-rays and of neutron radiations with a wide transfer momentum q in a short time without requiring mechanical rotation of a specimen or the like. <P>SOLUTION: An X-ray bundle is prepared by reflecting X-rays (neutron radiations) on a curved face of a reflective polychromator 1 consisting of curved crystals and converging the X-rays into a fan shape viewed from the upper face of a specimen S. The angle formed between the X-ray beam and the surface of the specimen continuously varies within a vertical surface according to a converging angle in the horizontal direction. The intensity distribution of the X-rays reflected by the surface of the specimen is measured by a two-dimensional detector 2, to acquire the reflectivity curve of the X-rays varying as a function of a scattering vector in a direction vertical to the surface of the specimen from the two-dimensional intensity distribution. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012013659(A) |
申请公布日期 |
2012.01.19 |
申请号 |
JP20100153310 |
申请日期 |
2010.07.05 |
申请人 |
HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION |
发明人 |
MATSUSHITA TADASHI;ARAKAWA ETSUO |
分类号 |
G01N23/201;G01N23/202 |
主分类号 |
G01N23/201 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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