发明名称 SUBSTRATE PROCESSING METHOD, SEMICONDUCTOR CHIP MANUFACTURING METHOD, AND RESIN-ADHESIVE-LAYER-BACKED SEMICONDUCTOR CHIP MANUFACTURING METHOD
摘要 To provide a substrate processing method and a semiconductor chip manufacturing method that enable low-cost formation of a mask for etching using plasma etching. During formation of a mask used in plasma dicing for separating a semiconductor wafer 1 into discrete semiconductor chips 1e by means of etching using plasma processing, there is adopted a method including printing a lyophobic liquid in an area on a rear surface 1b that is to be an objective of etching, thereby forming a lyophobic pattern made up of lyophobic films 3; supplying a low viscosity resin 4a and a high viscosity resin 4b, in this sequence, to the rear surface 1b on which the lyophobic pattern is formed, thereby forming a resin film 4 that is thicker than the lyophobic films 3 in an area where the lyophobic films 3 are not present; and curing the resin film 4, to thus form a mask 4* that covers an area except for the area to be etched. Thus, a mask for etching purpose can be formed at low cost without use of a high-cost method, like photolithography.
申请公布号 US2012015522(A1) 申请公布日期 2012.01.19
申请号 US201013256302 申请日期 2010.04.09
申请人 ARITA KIYOSHI;NISHINAKA TERUAKI;PANASONIC CORPORATION 发明人 ARITA KIYOSHI;NISHINAKA TERUAKI
分类号 H01L21/3065 主分类号 H01L21/3065
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